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[ pdf ] The Impedance Measurement Handbook

The Impedance Measurement Handbook Download
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Topic under  Impedance Measuring Devices
Source: www.tnlc.ncsu.edu 
File size: 1.6 MB
File type: pdf
Last download on: Fri Aug 18, 2017 10:51:22 PM
Short Desciption:
Many modern impedance measuring instruments measure the real and the imaginary ..... the conventional impedance measurement instruments have a voltage bias ...

Summary:
Paragraph 1-1 Impedance 1-1
1-2 Measuring impedance 1-3
1-3 Parasitics: there are no pure R, C or L . 1-3
1-4 True, effective and indicated values . 1-4
1-5 Component dependency factors . 1-5
SECTION 2 Impedance measurement instruments Paragraph 2-1 Measurement methods 2-1
2-2 Operating theory of practical instruments . 2-5
LF impedance measurement 2-3 Theory of auto balancing bridge method 2-5
2-4 Key measurement functions 2-8
2-4-1 OSC level 2-8
2-4-2 DC bias . 2-9
2-4-3 Ranging function 2-10
2-4-4 Level monitor function . 2-11
2-4-5 Measurement time and averaging 2-11
2-4-6 Compensation function 2-12
2-4-7 Guarding . 2-13
2-4-8 Grounded device measurement capability . 2-14
RF impedance measurement 2-5 Theory of RF I-V measurement method . 2-16
2-6 Difference between RF I-V and network analysis methods 2-18
2-7 Key measurement functions 2-20
2-7-1 OSC level 2-20
2-7-2 Test port . 2-20
2-7-3 Calibration . 2-21
2-7-4 Compensation . 2-21
2-7-5 Measurement range . 2-21
2-7-6 DC bias . 2-21
ii SECTION 3 Fixturing and cabling LF impedance measurement Paragraph 3-1 Terminal configuration 3-1
3-2 Using test cables at high frequencies . 3-5
3-3 Test fixtures . 3-5
3-3-1 Agilent supplied test fixtures 3-5
3-3-2 User fabricated test fixtures . 3-6
3-3-3 User test fixture example 3-7
3-4 Test cables 3-8
3-4-1 Agilent supplied test cables . 3-8
3-4-2 User fabricated test cable 3-8
3-4-3 Test cable extension . 3-9
3-5 Eliminating the stray capacitance effects 3-12
RF impedance measurement 3-6 Terminal configuration in RF region 3-12
3-7 RF test fixtures 3-13
3-7-1 Agilent supplied RF test fixtures 3-14
3-8 Test port extension in RF region . 3-15
SECTION 4 Measurement error and compensation Basic concepts and LF impedance measurement Paragraph 4-1 Measurement error 4-1
4-2 Calibration and compensation 4-1
4-2-1 Offset compensation . 4-2
4-2-2 Open and short compensations . 4-2
4-2-3 Precautions for open and short measurements 4-3
4-2-4 Open, short and load compensations 4-4
4-2-5 What should be used as the load? . 4-5
4-2-6 Application limit for open, short and load compensations 4-7
4-3 Error caused by contact resistance . 4-7
4-4 Measurement cable extension induced error . 4-9
4-5 Practical compensation examples . 4-11
RF impedance measurement 4-6 Calibration and compensation in RF region . 4-13
4-6-1 Calibration . 4-13
4-6-2 Error source model . 4-14
4-6-3 Compensation method . 4-15
4-6-4 Precautions for open and short measurements in RF region 4-15
4-6-5 Consideration for short compensation 4-16
4-6-6 Calibrating load device 4-17
4-6-7 Electrical length compensation . 4-18
4-6-8 Practical compensation technique 4-19
4-7 Measurement correlation and repeatability . 4-19
iii 4-7-1 Variance in residual parameter value 4-19
4-7-2 A difference in contact condition . 4-20
4-7-3 A difference in open and short compensation conditions 4-21
4-7-4 Electromagnetic coupling with a conductor near the DUT . 4-21
4-7-5 Variance in environmental temperature. 4-22
SECTION 5 Impedance measurement applications and enhancements Paragraph 5-1 Capacitor measurement 5-1
5-2 Inductor measurement 5-5
5-3 Transformer measurement 5-9
5-4 Diode measurement . 5-13
5-5 MOS FET measurement 5-14
5-6 Silicon wafer C-V measurement 5-15
5-7 High frequency impedance measurement using the probe . 5-18
5-8 Resonator measurement 5-20
5-9 Cable measurements . 5-23
5-10 Balanced device measurement 5-25
5-11 Battery measurement 5-27
5-12 Test signal voltage enhancement 5-28
5-13 DC bias voltage enhancement . 5-30
5-14 DC bias current enhancement 5-32
5-15 Equivalent circuit analysis function and its application . 5-34

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